WO2007008961A3 - Method and apparatus for parameter adjustment, testing, and configuration - Google Patents

Method and apparatus for parameter adjustment, testing, and configuration Download PDF

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Publication number
WO2007008961A3
WO2007008961A3 PCT/US2006/027014 US2006027014W WO2007008961A3 WO 2007008961 A3 WO2007008961 A3 WO 2007008961A3 US 2006027014 W US2006027014 W US 2006027014W WO 2007008961 A3 WO2007008961 A3 WO 2007008961A3
Authority
WO
WIPO (PCT)
Prior art keywords
testing
configuration
parameter adjustment
components
monitoring
Prior art date
Application number
PCT/US2006/027014
Other languages
French (fr)
Other versions
WO2007008961A2 (en
Inventor
Stanley Hronik
Original Assignee
Integrated Device Tech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Device Tech filed Critical Integrated Device Tech
Priority to CN2006800334877A priority Critical patent/CN101553737B/en
Priority to EP06786989A priority patent/EP1913409A4/en
Publication of WO2007008961A2 publication Critical patent/WO2007008961A2/en
Publication of WO2007008961A3 publication Critical patent/WO2007008961A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31718—Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3172—Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals

Abstract

A method and apparatus for parameter adjustment, testing and configuration pertaining to the testing of devices is disclosed. The method and apparatus allows tuning the interaction of components in a system for best performance, modifying the operation of components in a system, and monitoring changes in parameters which may predict degradation or failure. The method and apparatus may operate at the device, interface or system level. Through serial data chains, systems may be made to perform under selected or imposed operating conditions to allow configuration, testing, measuring or monitoring.
PCT/US2006/027014 2005-07-12 2006-07-12 Method and apparatus for parameter adjustment, testing, and configuration WO2007008961A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN2006800334877A CN101553737B (en) 2005-07-12 2006-07-12 Method and apparatus for parameter adjustment, testing, and configuration
EP06786989A EP1913409A4 (en) 2005-07-12 2006-07-12 Method and apparatus for parameter adjustment, testing, and configuration

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US69832005P 2005-07-12 2005-07-12
US60/698,320 2005-07-12
US11/395,602 US20070016835A1 (en) 2005-07-12 2006-03-31 Method and apparatus for parameter adjustment, testing, and configuration
US11/395,602 2006-03-31

Publications (2)

Publication Number Publication Date
WO2007008961A2 WO2007008961A2 (en) 2007-01-18
WO2007008961A3 true WO2007008961A3 (en) 2009-04-16

Family

ID=37637925

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/027014 WO2007008961A2 (en) 2005-07-12 2006-07-12 Method and apparatus for parameter adjustment, testing, and configuration

Country Status (4)

Country Link
US (2) US20070016835A1 (en)
EP (1) EP1913409A4 (en)
CN (1) CN101553737B (en)
WO (1) WO2007008961A2 (en)

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US10097313B2 (en) * 2016-08-02 2018-10-09 Avago Technologies General Ip (Singapore) Pte. Ltd. Backchannel protocol for link training and adaptation
US10169140B2 (en) 2016-10-18 2019-01-01 International Business Machines Corporation Loading a phase-locked loop (PLL) configuration using flash memory
US10419005B2 (en) * 2016-12-14 2019-09-17 Taiwan Semiconductor Manufacturing Co., Ltd. Phase-locked-loop architecture
CN109239514B (en) * 2018-08-03 2021-02-09 重庆川仪自动化股份有限公司 Short circuit and open circuit detection circuit of liquid level meter sensor
CN111489050A (en) * 2020-03-04 2020-08-04 广州明珞汽车装备有限公司 Maintenance task allocation method, system, device and storage medium
CN113049943A (en) * 2021-03-09 2021-06-29 普冉半导体(上海)股份有限公司 Test method for adjusting chip parameters
CN114594342B (en) * 2022-03-21 2023-03-28 国网安徽省电力有限公司电力科学研究院 Power distribution network ground fault judgment input waveform consistency processing method
CN115932373B (en) * 2022-11-22 2023-10-20 南方电网数字电网研究院有限公司 Voltage measuring probe, single-phase line and three-phase line voltage measuring method

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See also references of EP1913409A4 *

Also Published As

Publication number Publication date
EP1913409A2 (en) 2008-04-23
US8265219B1 (en) 2012-09-11
WO2007008961A2 (en) 2007-01-18
US20070016835A1 (en) 2007-01-18
CN101553737A (en) 2009-10-07
EP1913409A4 (en) 2010-11-17
CN101553737B (en) 2012-05-23

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